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high-frequency measurements of multilayer ceramic capacitorsA resonant coaxial transmission line, short circuited at one end and open circuited at the other, whose fundamental resonant frequency and Q factor are known, is perturbed with a test capacitor connected either in series at the shorted end of the line, or in shunt at the open end. Measuring the Q factor of the system with the delta f technique yields the effective series resistance, capacitance, and the Q factor of the test specimen. This method of measurement has the advantage that there are no adjustable elements to alter circuit conditions in an unprescribed way, the only variable is the frequency which can be measured with an uncertainty of less than 1 ppm, the loss of the line as a function of frequency is quite predictable, and the Q factor of the line can be made sufficiently high to support accurate measurements of low loss capacitors.
Document ID
19810017853
Document Type
Conference Paper
Authors
Lafferty, R. E.
(Boonton Electronics Parsippany, N.J., United States)
Maher, J. P.
(Sprague Electric Co. North Adams, MA, United States)
Date Acquired
August 11, 2013
Publication Date
June 1, 1981
Publication Information
Publication: NASA. Marshall Space Flight Center Capacitor Technol., Appl. and Reliability
Subject Category
ELECTRONICS AND ELECTRICAL ENGINEERING
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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