NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
failure analysis methods for capacitorsThe basic steps in the failure analysis of discrete capacitors used in electronic circuit boards and hybrid assemblies are described. These steps include: visual examination; functional test; disassembly; isolation of the failure site; and documentation.
Document ID
19810017855
Document Type
Conference Paper
Authors
Hildenbrand, R. L.
(Martin Marietta Corp. Denver, CO, United States)
Date Acquired
August 11, 2013
Publication Date
June 1, 1981
Publication Information
Publication: NASA. Marshall Space Flight Center Capacitor Technol., Appl. and Reliability
Subject Category
ELECTRONICS AND ELECTRICAL ENGINEERING
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

Related Records

IDRelationTitle19810017835Analytic PrimaryCapacitor Technologies, Applications and Reliability