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Application of surface analysis to solve problems of wearResults are presented for the use of surface analytical tools including field ion microscopy, Auger emission spectroscopy analysis (AES), cylindrical mirror Auger analysis and X-ray photoelectron spectroscopy (XPS). Data from the field ion microscope reveal adhesive transfer (wear) at the atomic level with the formation of surface compounds not found in the bulk, and AES reveals that this transfer will occur even in the presence of surface oxides. Both AES and XPS reveal that in abrasive wear with silicon carbide and diamond contacting the transition metals, the surface and the abrasive undergo a chemical or structural change which effects wear. With silicon carbide, silicon volatilizes leaving behind a pseudo-graphitic surface and the surface of diamond is observed to graphitize.
Document ID
19820006646
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Buckley, D. H.
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
September 4, 2013
Publication Date
January 1, 1981
Subject Category
Mechanical Engineering
Report/Patent Number
E-1069
NASA-TM-82753
Report Number: E-1069
Report Number: NASA-TM-82753
Meeting Information
Meeting: Ideele Traeger der SURTEC Berlin ''81
Location: Berlin
Country: Germany
Start Date: June 29, 1981
End Date: July 3, 1981
Accession Number
82N14519
Funding Number(s)
PROJECT: RTOP 506-53-12
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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