NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Press Enter or click the Search button to begin your search.

Back to Results
Within-field variability of plant and soil parametersThe variability of ground truth data collected for vegetation experiments was investigated. Two fields of wheat and one field of corn were sampled on two different dates. The variability of crop and soil parameters within a field, between two fields of the same type, and within a field over time were compared statistically. The number of samples from each test site required in order to be able to determine with confidence the mean and standard deviations for a given variable was determined. Eight samples were found to be adequate for plant height determinations, while twenty samples were required for plant moisture and soil moisture characterization. Eighteen samples were necessary for detecting within field variability over time and for between field variability for the same crop. The necessary sample sites vary according to the physiological growth stage of the crop and recent weather events that affect the moisture and/or height characteristics of the field in question.
Document ID
19820016686
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Ulaby, F. T.
(Kansas Univ. Center for Research, Inc. Lawrence, KS, United States)
Brisco, B.
(Kansas Univ. Center for Research, Inc. Lawrence, KS, United States)
Dobson, C.
(Kansas Univ. Center for Research, Inc. Lawrence, KS, United States)
Date Acquired
September 4, 2013
Publication Date
December 1, 1981
Subject Category
Earth Resources And Remote Sensing
Report/Patent Number
E82-10284
NAS 1.26:167573
SU-SL-TR-360-16
SR-K2-04227
NASA-CR-167573
Report Number: E82-10284
Report Number: NAS 1.26:167573
Report Number: SU-SL-TR-360-16
Report Number: SR-K2-04227
Report Number: NASA-CR-167573
Accession Number
82N24562
Funding Number(s)
CONTRACT_GRANT: NAS9-15421
PROJECT: PROJ. AGRISTARS
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
No Preview Available