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A generalized memory test algorithmA general algorithm for testing digital computer memory is presented. The test checks that (1) every bit can be cleared and set in each memory work, and (2) bits are not erroneously cleared and/or set elsewhere in memory at the same time. The algorithm can be applied to any size memory block and any size memory word. It is concise and efficient, requiring the very few cycles through memory. For example, a test of 16-bit-word-size memory requries only 384 cycles through memory. Approximately 15 seconds were required to test a 32K block of such memory, using a microcomputer having a cycle time of 133 nanoseconds.
Document ID
19820024095
Acquisition Source
Legacy CDMS
Document Type
Technical Memorandum (TM)
Authors
Milner, E. J.
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
September 4, 2013
Publication Date
July 1, 1982
Subject Category
Computer Programming And Software
Report/Patent Number
NAS 1.15:82874
NASA-TM-82874
E-1250
Report Number: NAS 1.15:82874
Report Number: NASA-TM-82874
Report Number: E-1250
Accession Number
82N31971
Funding Number(s)
PROJECT: RTOP 505-32-6B
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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