Methods and models for predicting fatigue crack growth under random loadingPapers are presented in the volume summarizing the baseline data, methodology, procedures, and results of a round-robin analysis which was conducted to predict the fatigue crack growth in 2219-T851 aluminum center-cracked specimens subjected to flight loading in random cycle-by-cycle format. The objective of the analysis was to assess whether data from constant-amplitude fatigue crack growth tests on center-cracked specimens can be used to predict fatigue crack growth lives under random loading. The following approaches are discussed in detail: a root-mean-square approach, a crack-closure model, a multi-parameter yield zone model, and a load-interaction model.
Document ID
19820036971
Acquisition Source
Legacy CDMS
Document Type
Book
Authors
Chang, J. B. (Rockwell International Corp. North American Aircraft Div., Los Angeles, CA, United States)
Hudson, C. M. (NASA Langley Research Center Hampton, VA, United States)