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A high resolution, field portable spectrometerThe design of a high resolution, field portable spectrometer system is presented. The system provides the spectral resolution previously available only with laboratory based systems. The system's portability allows for essential in situ measurements, provides rapid acquisition and calibration of spectral reflectance data over a wavelength band from about 300 to 1000 nm. Features include a calibration scheme for normalizing data to the incident radiation, and the injection of a spectral calibration signal. Laboratory tests indicate that the system will perform as expected, and plans are being made to integrate the system with a ground based active and passive microwave data acquisition system.
Document ID
19820044095
Acquisition Source
Legacy CDMS
Document Type
Conference Proceedings
Authors
Warren, G. L.
(Texas A&M Univ. College Station, TX, United States)
Jean, B. R.
(Texas A&M Univ. College Station, TX, United States)
Blanchard, A. J.
(Texas A&M Univ. College Station, TX, United States)
Walthall, C. L.
(Texas A & M University College Station, TX, United States)
Date Acquired
August 10, 2013
Publication Date
January 1, 1981
Subject Category
Instrumentation And Photography
Meeting Information
Meeting: In: International Symposium on Remote Sensing of Environment
Location: Ann Arbor, MI
Start Date: May 11, 1981
End Date: May 15, 1981
Accession Number
82A27630
Funding Number(s)
CONTRACT_GRANT: NGL-44-001-001
Distribution Limits
Public
Copyright
Other

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