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Measuring Excess Noise in SDL'sNew instrument gives quantitive information on "excess noise" in semiconductor-diode laser (SDL's). By proper selection of detector, instrument tests any SDL from visible wavelengths through thermal infrared. Lasers determine excess noise in SKL source by measuring photocurrent generated in photodetector exposed first to reference laser then to SKL under test.
Document ID
19830000004
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Katzberg, S. J. (Kentron International, Inc.)
Kowitz, H. R.
Rowland, C. W.
Shull, T. A.
Ruggles, S. L.
Matthews, L. F.
Date Acquired
August 11, 2013
Publication Date
August 1, 1983
Publication Information
Publication: NASA Tech Briefs
Volume: 7
Issue: 3
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
LAR-12938
ISSN: 0145-319X
Report Number: LAR-12938
Accession Number
83B10004
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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