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Probe Array for Testing Printed-Circuit SubstratesArray of tiny probes tests complex printed circuit boards prior to mounting of microcircuit chips and other active and passive components. Insertion and alignment of board, performance of entire computer-controlled test, and printing of results requires about a minute; performed manually same tests require as much as 30 hours.
Document ID
19830000059
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Roison, A.
(General Electric Co.)
Albert, C.
(General Electric Co.)
Bianchi, C.
(General Electric Co.)
Ehland, J.
(General Electric Co.)
Date Acquired
August 11, 2013
Publication Date
August 1, 1983
Publication Information
Publication: NASA Tech Briefs
Volume: 7
Issue: 3
ISSN: 0145-319X
Subject Category
Mechanics
Report/Patent Number
GSC-12759
Report Number: GSC-12759
ISSN: 0145-319X
Accession Number
83B10059
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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