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Improving Trace-Ion SensitivityBackground noise reduced by some special precautions. Blanket of argon flows over solution so no chance for contamination from air to creep in. Conventional pump replaced with one made of polytetrafluoroethlylene component and all metal couplings eliminated from flow lines. Used to improve quality control in integrated circuit fabrication, lens fabrication, and vacuum-tube assembly.
Document ID
19830000333
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Buggle, R. N. (Honeywell, Inc.)
Date Acquired
August 11, 2013
Publication Date
April 1, 1984
Publication Information
Publication: NASA Tech Briefs
ISSN: 0145-319X
Subject Category
Materials
Report/Patent Number
MFS-25766
Report Number: MFS-25766
ISSN: 0145-319X
Accession Number
83B10333
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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