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Finding Open Faults In CMOS CircuitsAlgorithm specifies sequence of input test signals and interpretation of resulting output signals for identifying stuck-open faults in complementary metal-oxide semiconductor (CMOS) integrated logic circuits. Incorporated in software for online production testing of CMOS circuits.
Document ID
19830000504
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Chandramouli, R. (CALTECH)
Date Acquired
August 11, 2013
Publication Date
November 1, 1984
Publication Information
Publication: NASA Tech Briefs
Volume: 8
Issue: 2
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
ISSN: 0145-319X
Report Number: NPO-15838
NPO-15838
Accession Number
83B10504
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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