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Bread board float zone experiment system for high purity siliconA breadboard float zone experimental system has been established at Westech Systems for use by NASA in the float zone experimental area. A used zoner of suitable size and flexibility was acquired and installed with the necessary utilities. Repairs, alignments and modifications were made to provide for dislocation free zoning of silicon. The zoner is capable of studying process parameters used in growing silicon in gravity and is flexible to allow trying of new features that will test concepts of zoning in microgravity. Characterizing the state of the art molten zones of a growing silicon crystal will establish the data base against which improvements of zoning in gravity or growing in microgravity can be compared. 25 mm diameter was chosen as the reference size, since growth in microgravity will be at that diameter or smaller for about the next 6 years. Dislocation free crystals were growtn in the 100 and 111 orientations, using a wide set of growth conditions. The zone shape at one set of conditions was measured, by simultaneously aluminum doping and freezing the zone, lengthwise slabbing and delineating by etching. The whole set of crystals, grown under various conditions, were slabbed, polished and striation etched, revealing the growth interface shape and the periodic and aperiodic natures of the striations.
Document ID
19830005874
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Kern, E. L.
(Westech Systems, Inc. Phoenix, AZ, United States)
Gill, G. L., Jr.
(Westech Systems, Inc. Phoenix, AZ, United States)
Date Acquired
September 4, 2013
Publication Date
June 17, 1982
Subject Category
Astronautics (General)
Report/Patent Number
NAS 1.26:170668
JA64
NASA-CR-170668
Report Number: NAS 1.26:170668
Report Number: JA64
Report Number: NASA-CR-170668
Accession Number
83N14145
Funding Number(s)
CONTRACT_GRANT: NAS8-34542
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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