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Dual exposure interferometryThe application of dual exposure differential interferometry to gas dynamics and flow visualization is discussed. A differential interferometer with Wallaston prisms can produce two complementary interference fringe systems, depending on the polarization of the incident light. If these two systems are superimposed on a film, with one exposure during a phenomenon, the other before or after, the phenomenon will appear on a uniform background. By regulating the interferometer to infinite fringe distance, a resolution limit of approximately lambda/500 can be obtained in the quantitative analysis of weak phase objects. This method was successfully applied to gas dynamic investigations.
Document ID
19830012991
Acquisition Source
Legacy CDMS
Document Type
Technical Memorandum (TM)
Authors
Smeets, G.
(NASA Headquarters Washington, DC United States)
George, A.
(NASA Headquarters Washington, DC United States)
Date Acquired
September 4, 2013
Publication Date
December 1, 1982
Subject Category
Fluid Mechanics And Heat Transfer
Report/Patent Number
NAS 1.15:77002
NASA-TM-77002
Report Number: NAS 1.15:77002
Report Number: NASA-TM-77002
Accession Number
83N21262
Funding Number(s)
CONTRACT_GRANT: NASW-3542
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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