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Measurement and analysis of periodic coupling in silicon-clad planar waveguidesComputer modeling studies indicate that planar dielectric waveguides clad with silicon exhibit a damped periodic oscillation in their attenuation and phase characteristics. The effect is due to a periodic coupling between the lossy, guided modes in the silicon film and the TE0 mode of the dielectric waveguide. Experimental confirmation of the periodic coupling for a wavelength of 632.8 nm is presented. Propagation characteristics for a wavelength of 1150 nm were investigated for application in integrated optical modulators. Frequency filtering properties of silicon-clad waveguides are also examined and it is shown that the silicon thickness controls the filter response curve.
Document ID
19830030952
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Mcwright, G. M.
(Virginia Univ. Charlottesville, VA, United States)
Batchman, T. E.
(Virginia Univ. Charlottesville, VA, United States)
Stanziano, M. S.
(Virginia, University Charlottesville, VA, United States)
Date Acquired
August 11, 2013
Publication Date
October 1, 1982
Publication Information
Publication: IEEE Transactions on Microwave Theory and Techniques
Volume: MTT-30
Subject Category
Optics
Accession Number
83A12170
Distribution Limits
Public
Copyright
Other

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