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Three-dimensional stylus profilometryThe method of three-dimensional stylus profilometry is presented together with a computer-based system for transforming the surface topography of a specimen into an intensity image. Examples are given in which intensity images obtained by stylus profilometry are compared with scanning electron micrographs and two other representations of the stylus data. The comparisons are made for three types of surface irregularities: a discrete feature, a periodic profile surface, and a random profile surface. It is shown that stylus profilometry provides high vertical resolution for low sloped surfaces and thus can be useful in revealing features not easily detectable with other methods.
Document ID
19830040784
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Teague, E. C.
(National Bureau of Standards Washington, DC, United States)
Scire, F. E.
(National Bureau of Standards Washington, DC, United States)
Baker, S. M.
(National Bureau of Standards Washington, DC, United States)
Jensen, S. W.
(National Bureau of Standards Washington, DC, United States)
Date Acquired
August 11, 2013
Publication Date
December 1, 1982
Subject Category
Instrumentation And Photography
Accession Number
83A22002
Funding Number(s)
CONTRACT_GRANT: NASA ORDER L-4718-B
Distribution Limits
Public
Copyright
Other

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