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Ride quality meterA ride quality meter is disclosed that automatically transforms vibration and noise measurements into a single number index of passenger discomfort. The noise measurements are converted into a noise discomfort value. The vibrations are converted into single axis discomfort values which are then converted into a combined axis discomfort value. The combined axis discomfort value is corrected for time duration and then summed with the noise discomfort value to obtain a total discomfort value.
Document ID
19840004377
Acquisition Source
Legacy CDMS
Document Type
Other - Patent
Authors
Leatherwood, J. D. (NASA Langley Research Center Hampton, VA, United States)
Dempsey, T. K. (NASA Langley Research Center Hampton, VA, United States)
Clevenson, S. A. (NASA Langley Research Center Hampton, VA, United States)
Stephens, D. G. (NASA Langley Research Center Hampton, VA, United States)
Date Acquired
September 4, 2013
Publication Date
November 8, 1983
Subject Category
Instrumentation And Photography
Report/Patent Number
Patent Number: NASA-CASE-LAR-12882-1
Patent Application Number: US-PATENT-APPL-SN-267179
Patent Number: US-PATENT-4,413,522
Accession Number
84N12445
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
NASA-CASE-LAR-12882-1|US-PATENT-4,413,522
Patent Application
US-PATENT-APPL-SN-267179

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