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Extensions and applications of a second-order landsurface parameterizationExtensions and applications of a second order land surface parameterization, proposed by Andreou and Eagleson are developed. Procedures for evaluating the near surface storage depth used in one cell land surface parameterizations are suggested and tested by using the model. Sensitivity analysis to the key soil parameters is performed. A case study involving comparison with an "exact" numerical model and another simplified parameterization, under very dry climatic conditions and for two different soil types, is also incorporated.
Document ID
19840008568
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Andreou, S. A.
(Massachusetts Inst. of Tech. Cambridge, MA, United States)
Eagleson, P. S.
(Massachusetts Inst. of Tech. Cambridge, MA, United States)
Date Acquired
September 4, 2013
Publication Date
July 1, 1983
Subject Category
Earth Resources And Remote Sensing
Report/Patent Number
MIT-R83-8
MIT-290
NASA-CR-175144
NAS 1.26:175144
Report Number: MIT-R83-8
Report Number: MIT-290
Report Number: NASA-CR-175144
Report Number: NAS 1.26:175144
Accession Number
84N16636
Funding Number(s)
CONTRACT_GRANT: NAG5-134
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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