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The AXAF technology program: The optical flats testsThe results of a technology program aimed at determining the limits of surface polishing for reflecting X-ray telescopes is presented. This program is part of the major task of developing the Advanced X-ray Astrophysical Facility (AXAF). By studying the optical properties of state-of-the-art polished flat surfaces, conclusions were drawn as to the potential capability of AXAF. Surface microtopography of the flats as well as their figure are studied by X-ray, visual, and mechanical techniques. These techniques and their results are described. The employed polishing techniques are more than adequate for the specifications of the AXAF mirrors.
Document ID
19840012273
Acquisition Source
Legacy CDMS
Document Type
Technical Memorandum (TM)
Authors
Williams, A. C.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Harper, J. D.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Reily, J. C.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Weisskopf, M. C.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Wyman, C. L.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Zombeck, M.
(Smithsonian Astrophysical Observatory)
Date Acquired
September 4, 2013
Publication Date
January 1, 1984
Subject Category
Optics
Report/Patent Number
NAS 1.15:82570
NASA-TM-82570
Report Number: NAS 1.15:82570
Report Number: NASA-TM-82570
Accession Number
84N20341
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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