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Characterization and measurement of polymer wearAnalytical tools which characterize the polymer wear process are discussed. The devices discussed include: visual observation of polymer wear with SEM, the quantification with surface profilometry and ellipsometry, to study the chemistry with AES, XPS and SIMS, to establish interfacial polymer orientation and accordingly bonding with QUARTIR, polymer state with Raman spectroscopy and stresses that develop in polymer films using a X-ray double crystal camera technique.
Document ID
19840013671
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Buckley, D. H.
(NASA Lewis Research Center Cleveland, OH, United States)
Aron, P. R.
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
September 4, 2013
Publication Date
April 11, 1984
Subject Category
Nonmetallic Materials
Report/Patent Number
NAS 1.15:83628
NASA-TM-83628
E-2033
Meeting Information
Meeting: Intern. Symp. on Polymer Wear and its Control
Location: St. Louis
Start Date: April 9, 1984
End Date: April 11, 1984
Sponsors: American Chemical Society
Accession Number
84N21739
Funding Number(s)
PROJECT: RTOP 506-53-1B
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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