Secondary pattern computation of an arbitrarily shaped main reflector

The secondary pattern of a perfectly conducting offset main reflector being illuminated by a point feed at an arbitrary location was studied. The method of analysis is based upon the application of the Fast Fourier Transform (FFT) to the aperture fields obtained using geometrical optics (GO) and geometrical theory of diffraction (GTD). Key features of the reflector surface is completely arbitrary, the incident field from the feed is most general with arbitrary polarization and location, and the edge diffraction is calculated by either UAT or by UTD. Comparison of this technique for an offset parabolic reflector with the Jacobi-Bessel and Fourier-Bessel techniques shows good agreement. Near field, far field, and scan data of a large reflector are presented.