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Ion mass spectrometerAn ion mass spectrometer is described which detects and indicates the characteristics of ions received over a wide angle, and which indicates the mass to charge ratio, the energy, and the direction of each detected ion. The spectrometer includes a magnetic analyzer having a sector magnet that passes ions received over a wide angle, and an electrostatic analyzer positioned to receive ions passing through the magnetic analyzer. The electrostatic analyzer includes a two dimensional ion sensor at one wall of the analyzer chamber, that senses not only the lengthwise position of the detected ion to indicate its mass to charge ratio, but also detects the ion position along the width of the chamber to indicate the direction in which the ion was traveling.
Document ID
19840019947
Acquisition Source
Legacy CDMS
Document Type
Other - Patent
Authors
Neugebauer, M.
(JPL California Inst. of Tech., Pasadena, United States)
Clay, D. R.
(NASA Pasadena Office CA, United States)
Goldstein, B. E.
(NASA Pasadena Office CA, United States)
Goldstein, R.
(NASA Pasadena Office CA, United States)
Date Acquired
September 4, 2013
Publication Date
March 6, 1984
Subject Category
Instrumentation And Photography
Report/Patent Number
Patent Number: NASA-CASE-NPO-15423-1
Patent Number: US-PATENT-4,435,642
Patent Application Number: US-PATENT-APPL-SN-361216
Accession Number
84N28016
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
NASA-CASE-NPO-15423-1|US-PATENT-4,435,642
Patent Application
US-PATENT-APPL-SN-361216
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