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Apparatus for measuring charged particle beamAn apparatus to measure the incident charged particle beam flux while effectively eliminating losses to reflection and/or secondary emission of the charged particle beam being measured is described. It comprises a sense cup through which the charged particle beam enters. A sense cone forms the rear wall of the interior chamber with the cone apex adjacent the entry opening. An outer case surrounds the sense cup and is electrically insulated therefrom. Charged particles entering the interior chamber are trapped and are absorbed by the sense cup and cone and travel through a current measuring device to ground.
Document ID
19840020506
Acquisition Source
Legacy CDMS
Document Type
Other - Patent
Authors
Gregory, D. A.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Stocks, C. D.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Date Acquired
September 4, 2013
Publication Date
June 19, 1984
Subject Category
Atomic And Molecular Physics
Report/Patent Number
Patent Number: US-PATENT-4,455,532
Patent Application Number: US-PATENT-APPL-SN-342857
Patent Number: NASA-CASE-MFS-25641-1
Accession Number
84N28575
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-PATENT-4,455,532|NASA-CASE-MFS-25641-1
Patent Application
US-PATENT-APPL-SN-342857
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