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NASA metrology information system: A NEMS subsystemthe NASA Metrology Information Systems (NMIS) is being developed as a standardized tool in managing the NASA field Center's instrument calibration programs. This system, as defined by the NASA Metrology and Calibration Workshop, will function as a subsystem of the newly developed NASA Equipment Management System (NEMS). The Metrology Information System is designed to utilize and update applicable NEMS data fields for controlled property and to function as a stand alone system for noncontrolled property. The NMIS provides automatic instrument calibration recall control, instrument historical performance data storage and analysis, calibration and repair labor and parts cost data, and instrument user and location data. Nineteen standardized reports were developed to analyze calibration system operations.
Document ID
19840025208
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
German, E. S., Jr.
(NASA Langley Research Center Hampton, VA, United States)
Kern, F. A.
(NASA Langley Research Center Hampton, VA, United States)
Yow, R. P.
(Planning Research Corp.)
Peterson, E.
(Planning Research Corp.)
Date Acquired
August 12, 2013
Publication Date
September 1, 1984
Publication Information
Publication: NASA, Washington NASA Admin. Data Base Management Systems, 1984
Subject Category
Documentation And Information Science
Accession Number
84N33279
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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