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Surface property modification of siliconThe main emphasis of this work has been to determine the wear rate of silicon in fluid environments and the parameters that influence wear. Three tests were carried out on single crystal Czochralski silicon wafers: circular and linear multiple-scratch tests in fluids by a pyramidal diamond simulated fixed-particle abrasion; microhardness and three-point bend tests were used to determine the hardness and fracture toughness of abraded silicon and the extent of damage induced by abrasion. The wear rate of (100) and (111) n and p-type single crystal Cz silicon abraded by a pyramidal diamond in ethanol, methanol, acetone and de-ionized water was determined by measuring the cross-sectional areas of grooves of the circular and linear multiple-scratch tests. The wear rate depends on the loads on the diamond and is highest for ethanol and lowest for de-ionized water. The surface morphology of the grooves showed lateral and median cracks as well as a plastically deformed region. The hardness and fracture toughness are critical parameters that influence the wear rate. Microhardness tests were conducted to determine the hardness as influenced by fluids. Median cracks and the damage zone surrounding the indentations were also related to the fluid properties.
Document ID
19840025952
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Danyluk, S.
(Illinois Univ. Chicago, IL, United States)
Date Acquired
September 4, 2013
Publication Date
January 1, 1984
Subject Category
Energy Production And Conversion
Report/Patent Number
NAS 1.26:173952
NASA-CR-173952
DOE/JPL-956053-84/05
JPL-9950-914
Report Number: NAS 1.26:173952
Report Number: NASA-CR-173952
Report Number: DOE/JPL-956053-84/05
Report Number: JPL-9950-914
Accession Number
84N34023
Funding Number(s)
CONTRACT_GRANT: JPL-956053
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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