NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Collections About News Help Login

The auto‑search feature has been disabled based on user feedback. Enter a search term/phrase and click “Search” to begin.

Back to Results
Microstructural characterization of SiC (SCS) filamentsMicrostructural features of SiC('SCS') fibers demonstrating growth properties have been investigated using scanning and transmission electron microscopy. An etchant of fused KOH:KNO3 was developed which adequately brought out previously undetermined features.
Document ID
19840031502
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Wawner, F. W. (Virginia Univ. Charlottesville, VA, United States)
Teng, A. Y. (Virginia, University Charlottesville, Charlottesville, VA, United States)
Nutt, S. R. (National Bureau of Standards Washington, DC, United States)
Date Acquired
August 12, 2013
Publication Date
April 1, 1983
Publication Information
Publication: SAMPE Quarterly
Volume: 14
ISSN: 0036-0821
Subject Category
Nonmetallic Materials
Report/Patent Number
ISSN: 0036-0821
Accession Number
84A14289
Distribution Limits
Public
Copyright
Other

Available Downloads

There are no available downloads for this record.

Related Records

There are no records associated with this record.
No Preview Available