Optical surface analysis code (OSAC)A computer program for the evaluation of surface ripple effects on an optical system is discussed. The program consists of a modification of conventional ray tracing so that the effects of all roughness frequency scales on image quality can be analyzed. The code is designed to deal with image quality problems arising in connection with X-ray telescopes and near-normal incidence systems used in the infrared, visible, and near-UV parts of the spectrum. The emphasis of the program analysis is on narrow angle scattering and its effect on image quality. The intent is to provide the optical engineer with a measure of the sensitivity of image quality to various surface characteristics. The paper will highlight some of the unique modeling features of the code, and illustrate some system examples.
Document ID
19840045768
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Noll, R. J. (Perkin-Elmer Corp. Danbury, CT, United States)
Glenn, P. E. (Perkin-Elmer Corp. Electro-Optical Div., Danbury, CT, United States)
Osantowski, J. (NASA Goddard Space Flight Center Greenbelt, MD, United States)