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Residue-Measure Model-Reduction TechniqueNew residue-measure criterion simplifies mathematical models of feedback-control systems. Although originally developed for flight control, approach applied to any flexible structural system involving dominantly linear dynamics.
Document ID
19850000137
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Gluch, D. P. (Honeywell, Inc.)
Date Acquired
August 12, 2013
Publication Date
June 1, 1985
Publication Information
Publication: NASA Tech Briefs
Volume: 9
Issue: 1
ISSN: 0145-319X
Subject Category
Mathematics And Information Sciences
Report/Patent Number
MSC-20369
Report Number: MSC-20369
ISSN: 0145-319X
Accession Number
85B10137
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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