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Single-Event-Upset Studies: A CompilationDocument summarizes 15 studies of single-event upsets covering 60 different types of semiconductor devices. Studies discussed in document include verification of basic reactions induced by heavy ions and protons and surveys of latchup and bit-flip susceptibility of several types of devices and device-fabrication technologies.
Document ID
19850000297
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Nichols, D. K. (Caltech)
Price, W. E. (Caltech)
Malone, C. J. (Caltech)
Smith, L. S. (Caltech)
Date Acquired
August 12, 2013
Publication Date
January 1, 1986
Publication Information
Publication: NASA Tech Briefs
Volume: 9
Issue: 3
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
NPO-16362
ISSN: 0145-319X
Report Number: NPO-16362
Accession Number
85B10297
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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