NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Press Enter or click the Search button to begin your search.

Back to Results
Analysis techniques for tracer studies of oxidationAnalysis techniques to obtain quantitative diffusion data from tracer concentration profiles were developed. Mass balance ideas were applied to determine the mechanism of oxide growth and to separate the fraction of inward and outward growth of oxide scales. The process of inward oxygen diffusion with exchange was theoretically modelled and the effect of lattice diffusivity, grain boundary diffusivity and grain size on the tracer concentration profile was studied. The development of the tracer concentration profile in a growing oxide scale was simulated. The double oxidation technique was applied to a FeCrAl-Zr alloy using 0-18 as a tracer. SIMS was used to obtain the tracer concentration profile. The formation of lacey oxide on the alloy was discussed. Careful consideration was given to the quality of data required to obtain quantitative information.
Document ID
19850003854
Acquisition Source
Legacy CDMS
Document Type
Thesis/Dissertation
Authors
Basu, S. N.
(Case Western Reserve Univ. Cleveland, OH, United States)
Date Acquired
September 5, 2013
Publication Date
November 1, 1984
Subject Category
Nonmetallic Materials
Report/Patent Number
NAS 1.26:174796
NASA-CR-174796
Report Number: NAS 1.26:174796
Report Number: NASA-CR-174796
Accession Number
85N12162
Funding Number(s)
CONTRACT_GRANT: NAG3-324
PROJECT: RTOP 505-33-1A
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
No Preview Available