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Float zone experiments in spaceThe molten zone/freezing crystal interface system and all the mechanisms were examined. If Marangoni convection produces oscillatory flows in the float zone of semiconductor materials, such as silicon, then it is unlikely that superior quality crystals can be grown in space using this process. The major goals were: (1) to determine the conditions for the onset of Marangoni flows in molten tin, a model system for low Prandtl number molten semiconductor materials; (2) to determine whether the flows can be suppressed by a thin oxide layer; and (3) based on experimental and mathematical analysis, to predict whether oscillatory flows will occur in the float zone silicon geometry in space, and if so, could it be suppressed by thin oxide or nitride films. Techniques were developed to analyze molten tin surfaces in a UHV system in a disk float zone geometry to minimize buoyancy flows. The critical Marangoni number for onset of oscillatory flows was determined to be greater than 4300 on atomically clean molten tin surfaces.
Document ID
19850007457
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Verhoeven, J. D.
(Ames Lab. IA, United States)
Noack, M. A.
(Ames Lab. IA, United States)
Gill, W. N.
(Ames Lab. IA, United States)
Hau, C. C.
(Ames Lab. IA, United States)
Date Acquired
September 5, 2013
Publication Date
September 1, 1984
Subject Category
Astronautics (General)
Report/Patent Number
UC-25
NAS 1.26:171284
IS-4872
NASA-CR-171284
Report Number: UC-25
Report Number: NAS 1.26:171284
Report Number: IS-4872
Report Number: NASA-CR-171284
Accession Number
85N15766
Funding Number(s)
CONTRACT_GRANT: NASA ORDER H-34328-B
PROJECT: RTOP 179-80-70
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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