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Measurement of the configuration of a concave surface by the interference of reflected lightA method whereby a concave surface is irradiated with coherent light and the resulting interference fringes yield information on the concave surface is described. This method can be applied to a surface which satisfies the following conditions: (1) the concave face has a mirror surface; (2) the profile of the face is expressed by a mathematical function with a point of inflection. In this interferometry, multilight waves reflected from the concave surface interfere and make fringes wherever the reflected light propagates. Interference fringe orders. Photographs of the fringe patterns for a uniformly loaded thin silicon plate clamped at the edge are shown experimentally. The experimental and the theoretical values of the maximum optical path difference show good agreement. This simple method can be applied to obtain accurate information on concave surfaces.
Document ID
19850012557
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Kumazawa, T.
(NASA Headquarters Washington, DC United States)
Sakamoto, T.
(NASA Headquarters Washington, DC United States)
Shida, S.
(NASA Headquarters Washington, DC United States)
Date Acquired
September 5, 2013
Publication Date
February 1, 1985
Subject Category
Optics
Report/Patent Number
NAS 1.15:77796
NASA-TM-77796
Report Number: NAS 1.15:77796
Report Number: NASA-TM-77796
Meeting Information
Meeting: Precision Instr. Acad. Spring Sci. Lecture Meeting
Location: Washington, DC
Country: United States
Start Date: March 22, 1982
Accession Number
85N20867
Funding Number(s)
CONTRACT_GRANT: NASW-4004
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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