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Kapton charging characteristics: Effects of material thickness and electron-energy distributionCharging characteristics of polyimide (Kapton) of varying thicknesses under irradiation by a very-low-curent-density electron beam, with the back surface of the sample grounded are reported. These charging characteristics are in good agreement with a simple analytical model which predicts that in thin samples at low current density, sample surface potential is limited by conduction leakage through the bulk material. The charging of Kapton in a low-current-density electron beam in which the beam energy was modulated to simulate Maxwellian and biMaxwellian distribution functions is measured.
Document ID
19850014202
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Williamson, W. S.
(Hughes Research Labs. Malibu, CA, United States)
Dulgeroff, C. R.
(Hughes Research Labs. Malibu, CA, United States)
Hymann, J.
(Hughes Research Labs. Malibu, CA, United States)
Viswanathan, R.
(Hughes Space and Communications Group Los Angeles, United States)
Date Acquired
August 12, 2013
Publication Date
March 1, 1985
Publication Information
Publication: NASA. Lewis Research Center Spacecraft Environ. Interactions Technol., 1983
Subject Category
Nonmetallic Materials
Accession Number
85N22513
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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