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Advanced detectors and signal processing for bubble memoriesThe feasibility of combining silicon and magnetic bubble technologies is demonstrated. Results of bubble film annealing indicate that a low temperature silicon on garnet technology is the most likely one to succeed commercially. Annealing ambients are also shown to have a major effect on the magnetic properties of bubble films. Functional MOSFETs were fabricated on bubble films coated with thick (approximately 1 micron) SiO2 layers. The two main problems with these silicon on garnet MOSFETs are low electron mobilities and large gate leakage currents. Results indicate that the laser recrystallized silicon and gate oxide (SiO2) layers are contaminated. The data suggest that part of the contaminating ions originate in the sputtered oxide spacer layer and part originates in the bubble film itself. A diffusion barrier, such as silicon nitride, placed between the bubble film and the silicon layer should eliminate the contamination induced problem.
Document ID
19850015908
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Kryder, M. H.
(Carnegie-Mellon Univ. Pittsburgh, PA, United States)
Rasky, P. H. L.
(Carnegie-Mellon Univ. Pittsburgh, PA, United States)
Greve, D. W.
(Carnegie-Mellon Univ. Pittsburgh, PA, United States)
Date Acquired
September 5, 2013
Publication Date
April 1, 1985
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
NASA-CR-172534
NAS 1.26:172534
Report Number: NASA-CR-172534
Report Number: NAS 1.26:172534
Accession Number
85N24219
Funding Number(s)
CONTRACT_GRANT: NAG1-395
PROJECT: RTOP 506-53-18
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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