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Cryogenic Laser Calorimetry for Impurity AnalysisThe results of a one-year effort to determine the applicability of laser-calorimetric spectroscopy to the study of deep-level impurities in silicon are presented. Critical considerations for impurity analysis by laser-calorimetric spectroscopy are discussed, the design and performance of a cryogenic laser calorimeter is described, and measurements of background absorption in high-purity silicon are presented.
Document ID
19850024888
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Swimm, R. T.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
September 5, 2013
Publication Date
May 1, 1985
Subject Category
Inorganic And Physical Chemistry
Report/Patent Number
NAS 1.26:176102
NASA-CR-176102
Report Number: NAS 1.26:176102
Report Number: NASA-CR-176102
Accession Number
85N33201
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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