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Fizeau wavemeter for pulsed laser wavelength measurementA Fizeau wavelength meter optimized for use with pulsed laser sources has been developed and characterized which demonstrates a CW resolution better than 2 parts in 10 to the 7th and a pulsed resolution better than 1 part in 10 to the 6th. The static optical design is based on a Fizeau wedge interferometer, which together with spatial filtering and collimating optics is used to produce a pattern of parallel fringes which is imaged on a linear photodiode array and analyzed by a minicomputer. A series of CW and pulsed measurements of various narrowband laser sources are described, and particular difficulties involved in pulsed laser measurements with the wavemeter are examined.
Document ID
19850030712
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Morris, M. B.
(Maryland Univ. College Park, MD, United States)
Mcilrath, T. J.
(Maryland, University College Park, MD, United States)
Synder, J. J.
(National Bureau of Standards, Center for Basic Standards, Gaithersburg MD, United States)
Date Acquired
August 12, 2013
Publication Date
November 1, 1984
Publication Information
Publication: Applied Optics
Volume: 23
ISSN: 0003-6935
Subject Category
Instrumentation And Photography
Report/Patent Number
ISSN: 0003-6935
Accession Number
85A12863
Funding Number(s)
CONTRACT_GRANT: NSG-5313
CONTRACT_GRANT: NSF CPE-81-19250
Distribution Limits
Public
Copyright
Other

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