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Remote displacement measurements using a laser diodeA technique for measuring displacements remotely to minimum distances of 8 mm with a resolution of 2 microns is described. A dynamic interferometer method is employed using a frequency-ramped laser diode. A direct measurement of the period of the resulting beat signal is used to determine the displacement.
Document ID
19850042313
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Beheim, G. (NASA Lewis Research Center Cleveland, OH, United States)
Fritsch, K. (John Carroll University Cleveland, OH, United States)
Date Acquired
August 12, 2013
Publication Date
January 31, 1985
Publication Information
Publication: Electronics Letters
Volume: 21
ISSN: 0013-5194
Subject Category
Instrumentation And Photography
Report/Patent Number
ISSN: 0013-5194
Accession Number
85A24464
Distribution Limits
Public
Copyright
Other

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