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Potential of CCDs for UV and X-ray plasma diagnosticsA program is under way to develop charge-coupled device (CCD) sensors for space-based X-ray astronomy imaging spectrometers. To date, laboratory line-emission spectra have been acquired throughout the range of 277 to 8000 eV (carbon through copper K-alpha emission) and CCD sensitivity has been demonstrated throughout the range of 1.1 through 8000 eV. Image resolution is excellent, limited almost entirely by the 15 micron pixel size. These results are presented and specialized techniques are described which permit such low energy response, high spectral resolution, and efficient charge collection. Finally, analysis is presented of one particular CCD characteristic which currently limits UV and X-ray performance: charge diffusion.
Document ID
19850055068
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
Janesick, J. R.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Elliott, T.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Marsh, H. H.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Collins, S.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Mccarthy, J. K.
(California Institute of Technology, Jet Propulsion Laboratory, Pasadena CA, United States)
Blouke, M. M.
(Tektronix, Inc. Beaverton, OR, United States)
Date Acquired
August 12, 2013
Publication Date
May 1, 1985
Publication Information
Publication: Review of Scientific Instruments
Volume: 56
ISSN: 0034-6748
Subject Category
Instrumentation And Photography
Report/Patent Number
ISSN: 0034-6748
Accession Number
85A37219
Distribution Limits
Public
Copyright
Other

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