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Quantitative flaw characterization with scanning laser acoustic microscopySurface roughness and diffraction are two factors that have been observed to affect the accuracy of flaw characterization with scanning laser acoustic microscopy. In accuracies can arise when the surface of the test sample is acoustically rough. It is shown that, in this case, Snell's law is no longer valid for determining the direction of sound propagation within the sample. The relationship between the direction of sound propagation within the sample, the apparent flaw depth, and the sample's surface roughness is investigated. Diffraction effects can mask the acoustic images of minute flaws and make it difficult to establish their size, depth, and other characteristics. It is shown that for Fraunhofer diffraction conditions the acoustic image of a subsurface defect corresponds to a two-dimensional Fourier transform. Transforms based on simulated flaws are used to infer the size and shape of the actual flaw.
Document ID
19860013512
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Generazio, E. R. (NASA Lewis Research Center Cleveland, OH, United States)
Roth, D. J. (NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
August 12, 2013
Publication Date
January 1, 1986
Publication Information
Publication: Analytical Ultrasonics in Materials Research and Testing
IDRelationTitle19860013491Collected WorksAnalytical Ultrasonics in Materials Research and Testing19860013491Collected WorksAnalytical Ultrasonics in Materials Research and Testing