Set-up and demonstration of a Low Energy Electron Magnetometer (LEEM)

Described are the design, construction and test results of a Low Energy Electron Magnetometer (LEEM). The electron source is a commercial electron gun capable of providing several microamperes of electron beam. These electrons, after acceleration through a selected potential difference of 100-300 volts, are sent through two 30 degree second-order focussing parallel plate electrostatic analyzers. The first analyzer acts as a monochromator located in the field-free space. It is capable of providing energy resolution of better than 10 to the -3 power. The second analyzer, located in the test field region, acts as the detector for electrons deflected by the test field. The entire magnetometer system is expected to have a resolution of 1 part in 1000 or better.