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Technology for satellite power conversionThe work performed in this reporting period has concentrated on the metal-oxide-metal (MOM) diode. The fabrication procedure begins with the deposition of gold probing pads to provide a non-oxidizing contact to test the dc characteristics to the diode accurately. A thin patch capped with an insulating SiO2 layer, is deposited next to form the first half of the diode. The other half of the diode, typically Ni, is deposited completing the conduction path from the oxidized edge of the Ni patch to the opposite gold probing pad. It is important in this step that the last metallization take place without exposing the newly oxidized surface to the atmosphere. Successful production of diodes has been achieved. Work on millimeter wave frequency rectennas incorporating known semiconductor diode technology has been initiated.
Document ID
19860015571
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Gouker, M. A.
(Georgia Inst. of Tech. Atlanta, GA, United States)
Campbell, D. P.
(Georgia Inst. of Tech. Atlanta, GA, United States)
Gallagher, J. J.
(Georgia Inst. of Tech. Atlanta, GA, United States)
Date Acquired
September 5, 2013
Publication Date
May 16, 1986
Subject Category
Energy Production And Conversion
Report/Patent Number
NASA-CR-176777
NAS 1.26:176777
Report Number: NASA-CR-176777
Report Number: NAS 1.26:176777
Accession Number
86N25042
Funding Number(s)
CONTRACT_GRANT: NAG3-282
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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