NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Press Enter or click the Search button to begin your search.

Back to Results
Thermal and electrical contact conductance studiesPrediction of electrical and thermal contact resistance for pressed, nominally flat contacts is complicated by the large number of variables which influence contact formation. This is reflected in experimental results as a wide variation in contact resistances, spanning up to six orders of magnitude. A series of experiments were performed to observe the effects of oxidation and surface roughness on contact resistance. Electrical contact resistance and thermal contact conductance from 4 to 290 K on OFHC Cu contacts are reported. Electrical contact resistance was measured with a 4-wire DC technique. Thermal contact conductance was determined by steady-state longitudinal heat flow. Corrections for the bulk contribution ot the overall measured resistance were made, with the remaining resistance due solely to the presence of the contact.
Document ID
19860021906
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Vansciver, S. W.
(Wisconsin Univ. Madison, WI, United States)
Nilles, M.
(Wisconsin Univ. Madison, WI, United States)
Date Acquired
September 5, 2013
Publication Date
January 1, 1985
Subject Category
Solid-State Physics
Report/Patent Number
NASA-CR-177093
NAS 1.26:177093
Report Number: NASA-CR-177093
Report Number: NAS 1.26:177093
Accession Number
86N31378
Funding Number(s)
CONTRACT_GRANT: NAG2-242
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
No Preview Available