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Quantitative void characterization in structural ceramics using scanning laser acoustic microscopyThe ability of scanning laser acoustic microscopy (SLAM) to characterize artificially seeded voids in sintered silicon nitride structural ceramic specimens was investigated. Using trigonometric relationships and Airy's diffraction theory, predictions of internal void depth and size were obtained from acoustic diffraction patterns produced by the voids. Agreement was observed between actual and predicted void depths. However, predicted void diameters were generally much greater than actual diameters. Precise diameter predictions are difficult to obtain due to measurement uncertainty and the limitations of 100 MHz SLAM applied to typical ceramic specimens.
Document ID
19860022441
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Roth, D. J.
(NASA Lewis Research Center Cleveland, OH, United States)
Generazio, E. R.
(NASA Lewis Research Center Cleveland, OH, United States)
Baaklini, G. Y.
(Cleveland State Univ. Ohio, United States)
Date Acquired
September 5, 2013
Publication Date
January 1, 1986
Subject Category
Quality Assurance And Reliability
Report/Patent Number
E-3166
NAS 1.15:88797
NASA-TM-88797
Report Number: E-3166
Report Number: NAS 1.15:88797
Report Number: NASA-TM-88797
Meeting Information
Meeting: Basic Science, Electronics and Glass Divisions Joint Meeting
Location: New Orleans, LA
Country: United States
Start Date: November 2, 1986
End Date: November 5, 1986
Sponsors: American Ceramic Society
Accession Number
86N31913
Funding Number(s)
PROJECT: RTOP 533-05-01
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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