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Measuring Conductor Widths and Spacings ElectricallyWidths and spacings of conductor lines on integrated circuits measured electrically by split cross-bridge resistor technique. Speeds evaluation of integrated-circuit fabrication processes. When measurement of probe currents and voltages and reduction of measurement data automated, test structure probed and characterized in less than one second.
Document ID
19870000306
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Buehler, Martin G.
(Caltech)
Date Acquired
August 13, 2013
Publication Date
July 1, 1987
Publication Information
Publication: NASA Tech Briefs
Volume: 11
Issue: 7
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
NPO-16021
ISSN: 0145-319X
Report Number: NPO-16021
Accession Number
87B10306
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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