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Electron-Focus Adjustment for Photo-Optical ImagersInternal electron focus made independent of optical focus. Procedure enables fine tuning of internal electron-focusing system of photo-optical imager, without complication by imperfections of associated external optics. Applicable to imager in which electrons emitted from photocathode in optical focal plane, then electrostatically and/or magnetically focused to replica of image in second focal plane containing photodiodes, phototransistorss, charge-coupled devices, multiple-anode outputs, or other detectors.
Document ID
19870000383
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Fowler, Walter B. (NASA Goddard Space Flight Center, Greenbelt, Md.)
Flemming, Keith (NASA Goddard Space Flight Center, Greenbelt, Md.)
Ziegler, Michael M. (NASA Goddard Space Flight Center, Greenbelt, Md.)
Date Acquired
August 13, 2013
Publication Date
September 1, 1987
Publication Information
Publication: NASA Tech Briefs
Volume: 11
Issue: 8
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
GSC-12890
ISSN: 0145-319X
Report Number: GSC-12890
Accession Number
87B10383
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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