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FET charge sensor and voltage probeA MOSFET structure having a biased gate covered with an insulator is described. The insulator is of such a thickness as to render the structure capable of giving a measure of accumulated charge. The structure is also capable of being used in a stacked structure as a particle spectrometer.
Document ID
19870003880
Acquisition Source
Legacy CDMS
Document Type
Other - Patent
Authors
Robinson, P. A., Jr.
(NASA Pasadena Office CA, United States)
Date Acquired
August 13, 2013
Publication Date
August 12, 1986
Subject Category
Solid-State Physics
Report/Patent Number
Patent Number: US-PATENT-4,605,946
Patent Application Number: US-PATENT-APPL-SN-641146
Patent Number: NASA-CASE-NPO-16045-1
Accession Number
87N13313
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-PATENT-4,605,946|NASA-CASE-NPO-16045-1
Patent Application
US-PATENT-APPL-SN-641146
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