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Solar cell reliability testingThe progress and initial data on accelerated stress tests on small amorphous silicon test samples from several manufacturers are reported. The test samples include both single and tandem junction devices.
Document ID
19870006996
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Lathrop, J. (Clemson Univ. SC, United States)
Date Acquired
September 5, 2013
Publication Date
January 1, 1986
Publication Information
Publication: JPL, California Inst. of Tech., Pasadena Proceedings of the 26th Project Integration Meeting
Subject Category
Energy Production And Conversion
Accession Number
87N16429
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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