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RF characterization of monolithic microwave and mm-wave ICsA number of fixturing techniques compatible with automatic network analysis are presented. The fixtures are capable of characterizing GaAs Monolithic Microwave Integrated Circuits (MMICs) at K and Ka band. Several different transitions are used to couple the RF test port to microstrip. Fixtures which provide chip level de-embedding are included. In addition, two advanced characterization techniques are assessed.
Document ID
19870012632
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Romanofsky, R. R.
(NASA Lewis Research Center Cleveland, OH, United States)
Ponchak, G. E.
(NASA Lewis Research Center Cleveland, OH, United States)
Shalkhauser, K. A.
(NASA Lewis Research Center Cleveland, OH, United States)
Bhasin, K. B.
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
September 5, 2013
Publication Date
January 1, 1986
Subject Category
Communications And Radar
Report/Patent Number
NASA-TM-88948
E-3259
NAS 1.15:88948
Report Number: NASA-TM-88948
Report Number: E-3259
Report Number: NAS 1.15:88948
Accession Number
87N22065
Funding Number(s)
PROJECT: RTOP 506-44-21
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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