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Reflectance spectra of mafic silicates and phyllosilicates from .6 to 4.6 micronsThe results of spectral measurements for mafic silicates are given. The study provided valuable spectral reflectance information about mafic silicates and phyllosilicates in the 2.5 to 4.6 micron wavelength region. It was shown that the reflectance of these materials is strongly affected by the presence of H2O and OH. Therefore, the identification of these absorbing species is greatly enhanced.
Document ID
19870013988
Acquisition Source
Legacy CDMS
Document Type
Other
Authors
Roush, Ted L.
(Hawaii Univ. Honolulu, HI, United States)
Singer, Robert B.
(Hawaii Univ. Honolulu, HI, United States)
Mccord, Thomas B.
(Hawaii Univ. Honolulu, HI, United States)
Date Acquired
September 5, 2013
Publication Date
May 1, 1987
Publication Information
Publication: NASA, Washington, Reports of Planetary Geology and Geophysics Program, 1986
Subject Category
Astronomy
Accession Number
87N23421
Funding Number(s)
CONTRACT_GRANT: NSG-7312
CONTRACT_GRANT: NSG-7590
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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