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Optical strain measurement system developmentA laser speckle, differential strain measurement system has been built and tested for future applications in hostile environments. One-dimensional electronic correlation of speckle pattern movement allows a quasi-real time measure of strain. The system has been used successfully to measure uniaxial strain reaching into plastic deformation of a test specimen, at temperatures ranging to 450 C. A resolution of 16 microstrain is given by the photodiode array sensor pitch and the specimen to sensor separation. The strain measurement error is estimated to be +/-18 microstrain +/-3 percent of the strain reading. The upper temperature limit of the gauge is determined by air density perturbations causing decorrelation of the reference and shifted speckle patterns, and may be improved by limiting convective flow in the immediate vicinity of the test specimen.
Document ID
19870016893
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Lant, Christian T.
(Sverdrup Technology, Inc. Arnold AFS, TN, United States)
Qaqish, Walid
(Sverdrup Technology, Inc. Arnold AFS, TN, United States)
Date Acquired
September 5, 2013
Publication Date
July 1, 1987
Subject Category
Instrumentation And Photography
Report/Patent Number
NAS 1.26:179646
E-3678
NASA-CR-179646
Report Number: NAS 1.26:179646
Report Number: E-3678
Report Number: NASA-CR-179646
Accession Number
87N26326
Funding Number(s)
PROJECT: RTOP 506-42-11
CONTRACT_GRANT: NAS3-24105
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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