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Electronics reliability and measurement technologyA summary is presented of the Electronics Reliability and Measurement Technology Workshop. The meeting examined the U.S. electronics industry with particular focus on reliability and state-of-the-art technology. A general consensus of the approximately 75 attendees was that "the U.S. electronics industries are facing a crisis that may threaten their existence". The workshop had specific objectives to discuss mechanisms to improve areas such as reliability, yield, and performance while reducing failure rates, delivery times, and cost. The findings of the workshop addressed various aspects of the industry from wafers to parts to assemblies. Key problem areas that were singled out for attention are identified, and action items necessary to accomplish their resolution are recommended.
Document ID
19870017771
Acquisition Source
Legacy CDMS
Document Type
Conference Proceedings
Authors
Heyman, Joseph S.
(NASA Langley Research Center Hampton, VA, United States)
Date Acquired
September 5, 2013
Publication Date
August 1, 1987
Subject Category
Quality Assurance And Reliability
Report/Patent Number
NASA-CP-2472
NAS 1.55:2472
L-16315
Report Number: NASA-CP-2472
Report Number: NAS 1.55:2472
Report Number: L-16315
Accession Number
87N27204
Funding Number(s)
PROJECT: RTOP 323-51-66-01
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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